Interview with Prof. John Hinde on becoming President-Elect of the International Biometric Society

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  • Author: Statistics Views
  • Date: 16 January 2013
  • Copyright: Video: Statistics Views Image: Professor John Hinde

During last summer, John Hinde, Professor of Statistics at NUI Galway was elected as the next President for the International Biometric Society. This year he steps in as Vice-President before becoming President in 2014. Statistics Views met up with Professor Hinde last month to ask about his plans for the Society, the International Year of Statistics and his own career. In celebration of the International Year of Statistics, Wiley have a virtual issue in biometrics freely available to read here.

thumbnail image: Interview with Prof. John Hinde on becoming President-Elect of the International Biometric Society

For the full interview, including further questions, please visit here.























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