Quality and Reliability Engineering International

Table of Contents

Volume 32 Issue 4 (June 2016)

1275-1590

Issue Information – Aims and Scope

Issue Information ‐ Aims and Scope

  • Author:
  • Pub Online: Apr 21, 2016
  • DOI: 10.1002/qre.1878 (p 1275-1275)

Issue Information ‐ JIP

Issue Information ‐ JIP

  • Author:
  • Pub Online: Apr 21, 2016
  • DOI: 10.1002/qre.1879 (p 1276-1276)

Issue Information ‐ TOC

Issue Information ‐ TOC

  • Author:
  • Pub Online: Apr 21, 2016
  • DOI: 10.1002/qre.1877 (p 1277-1278)

Editorials

Why Do Lean Six Sigma Projects Sometimes Fail?

  • Author: Douglas C. Montgomery
  • Pub Online: Apr 21, 2016
  • DOI: 10.1002/qre.2009 (p 1279-1279)

Review Articles

Process Yield for Multivariate Linear Profiles with One‐sided Specification Limits

  • Author: Fu‐Kwun Wang, Yeneneh Tamirat
  • Pub Online: Jul 14, 2015
  • DOI: 10.1002/qre.1834 (p 1281-1293)

Reliability Model for Electronic Devices under Time Varying Voltage

  • Author: Luis Carlos Méndez González, Manuel Iván Rodríguez Borbón, Delia J. Valles‐Rosales, Arturo Del Valle, Arnoldo Rodriguez
  • Pub Online: Oct 01, 2015
  • DOI: 10.1002/qre.1867 (p 1295-1306)

Research Articles

Monitoring of Multiple Binary Data Streams using a Hierarchical Model Structure

  • Author: Devashish Das, Yong Chen, Shiyu Zhou, Crispian Sievenpiper
  • Pub Online: Jul 20, 2015
  • DOI: 10.1002/qre.1831 (p 1307-1319)

Non‐normal Capability Indices for the Weibull and Lognormal Distributions

  • Author: Manuel R. Piña‐Monarrez, Jesús F. Ortiz‐Yañez, Manuel I. Rodríguez‐Borbón
  • Pub Online: Jul 03, 2015
  • DOI: 10.1002/qre.1832 (p 1321-1329)

Integrating Customer Perception into Process Capability Measures

  • Author: Anintaya Khamkanya, Byung Rae Cho, Paul L. Goethals
  • Pub Online: Jul 14, 2015
  • DOI: 10.1002/qre.1833 (p 1331-1345)

A comparative study of memory‐type control charts under normal and contaminated normal environments

  • Author: Hafiz Zafar Nazir, Nasir Abbas, Muhammad Riaz, Ronald J.M.M. Does
  • Pub Online: Jul 07, 2015
  • DOI: 10.1002/qre.1835 (p 1347-1356)

On the Performance of Shewhart‐type Synthetic and Runs‐rules Charts Combined with an X¯ Chart

  • Author: S. C. Shongwe, M. A. Graham
  • Pub Online: Jul 20, 2015
  • DOI: 10.1002/qre.1836 (p 1357-1379)

Attribute Control Charts with Optimal Limits

  • Author: Negin Enayaty Ahangar, Justin R. Chimka
  • Pub Online: Jul 07, 2015
  • DOI: 10.1002/qre.1839 (p 1381-1391)

Reliability of a Multi‐State Computer Network Through k Minimal Paths Within Tolerable Error Rate and Time Threshold

  • Author: Yi‐Kuei Lin, Cheng‐Fu Huang
  • Pub Online: Jul 14, 2015
  • DOI: 10.1002/qre.1840 (p 1393-1405)

Control Charts for the Lognormal Mean

  • Author: Wei‐Heng Huang, Hsiuying Wang, Arthur B. Yeh
  • Pub Online: Jul 03, 2015
  • DOI: 10.1002/qre.1841 (p 1407-1416)

On Effective Dual Use of Auxiliary Information in Variability Control Charts

  • Author: Muhammad Riaz, Rashid Mehmood, Nasir Abbas, Saddam Akber Abbasi
  • Pub Online: Aug 13, 2015
  • DOI: 10.1002/qre.1848 (p 1417-1443)
Page:   1 2 Next

Related Topics

Related Publications

Related Content

Site Footer

Address:

This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.