Quality and Reliability Engineering International

Table of Contents

Volume 2 Issue 3 (July 1986)

fmi-fmi, 141-218

Masthead

Masthead

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020301 (p fmi-fmi)

Editorial

Quality, reliability and scientific research

  • Author: FINN JENSE.
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020302 (p 141-142)

Articles

Use of liquid‐crystal thermography for defect location on semiconductor devices

  • Author: F. Beck
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020303 (p 143-151)

Calculation of optimum proof test intervals for maximum availability

  • Author: Geoff R. Duke
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020304 (p 153-158)

The test needs of application‐specific integrated circuits

  • Author: Chris Davison
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020305 (p 159-164)

Cathode ray tube bleed resistor reliability—a case study

  • Author: Peter Hale, Iain Mactaggart, Martin Shaw
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020306 (p 165-170)

Production reliability in flexible manufacturing systems

  • Author: K. Khodabandehloo, R. S. Sayles
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020307 (p 171-182)

Optimum replacement of deteriorating and inadequate equipment

  • Author: H. S. Blanks, M. J. Tordon
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020308 (p 183-198)

Fatigue analysis for crack initiation

  • Author: Charles C. S. Yen
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020309 (p 199-208)

News Digest

News Digest

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020310 (p 209-212)

Research and Methods

Research And Methods

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020311 (p 213-214)

R and M Reports

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020312 (p 214-215)

Book Reviews

Quality Assurance, L. Stebbing. Ellis Horwood, Chichester. No. of pages: 231. Price: £25.00

  • Author: P.D.T.O' CONNOR.
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680020314 (p 216-216)
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