Quality and Reliability Engineering International

Table of Contents

Volume 4 Issue 3 (July/September 1988)

fmi-fmi, 207-298

Masthead

Masthead

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040301 (p fmi-fmi)

Editorial

Editorial

  • Author: KAM L. WON
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040302 (p 207-207)

Articles

Short communication environmental stressing for quality and reliability engineers

  • Author: Wayne Tustin
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040303 (p 209-213)

The effect of pretinning on the strength of a chip carrier solder joint

  • Author: Susanne Ohlsson
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040304 (p 215-221)

Load‐strength simulation of plastic mouldings

  • Author: Valter Loll
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040305 (p 223-226)

Reliability prediction: A constructive critique of MIL‐HDBK‐217E

  • Author: Henry S. Blanks
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040306 (p 227-234)

Interval reliability of spare part stocks

  • Author: Igor Bazovsky, Glen Benz
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040307 (p 235-246)

Death by a thousand cuts: The physics of device failure through a series of activated, microscopic events

  • Author: A. J. Holden, R. W. Allen, K. Beasley, D. R. Parker
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040308 (p 247-254)

Subsurface burnout mechanisms in gallium arsenide (GAAS) electronic devices

  • Author: W. T. Anderson, D. V. Morgan, F. A. Buot, A. Christou
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040309 (p 255-268)

Reliability and failure patterns arising from fatigue

  • Author: A. D. S. Carter
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040310 (p 269-277)

The bathtub does not hold water any more

  • Author: Kam L. Wong
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040311 (p 279-282)

Miscellaneous

News Digest

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040312 (p 283-286)

Call for Papers

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040313 (p 287-287)

International calendar of forthcoming events

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040314 (p 288-291)

Courses in quality and reliability

  • Author:
  • Pub Online: Jan 03, 2007
  • DOI: 10.1002/qre.4680040315 (p 291-293)
Page:   1 2 Next

Related Topics

Related Publications

Related Content

Site Footer

Address:

This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.