Quality and Reliability Engineering International

Table of Contents

Volume 9 Issue 4 (July/August 1993)

fmi-fmi, 237-398

Articles

Limitations of oxide breakdown accelerated testing for reliability simulation

  • Author: M. Nafría, J. Suñé, X. Aymerich
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090416 (p 333-336)

Two‐dimensional modelling and characterization of gate‐to‐drain overlap contribution on the leakage current of a MOSFET, used as a GCD

  • Author: E. Ciantar, S. Burgniard, R. Jérisian, J. Oualid
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090417 (p 337-340)

Reliability issues of offset drain transistors after different modes of electrical stress

  • Author: C. Papadas, P. Mortini, C. Monsérié, G. Ghibaudo, G. Pananakakis
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090418 (p 341-346)

Reliability simulations of the endurance performance of FLOTOX EEPROM cells using spice

  • Author: F. Gigon, C. Papadas, G. Ghibaudo, G. Pananakakis, P. Mortini
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090419 (p 347-352)

Analysis of MOS SOI transistor degradation

  • Author: V. Berland, A. Touboul, O. Flament
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090420 (p 353-357)

Low frequency noise and reliability analysis of avalanche photodiodes

  • Author: B. K. Jones, D. A. Kozlowski
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090421 (p 359-362)

Degradation behaviour of highly coherent 1‐55 μm long‐cavity multiple quantum well DFB lasers

  • Author: Mitsuo Fukuda, Fumiyoshi Kano, Takeshi Kurosaki, Jun‐Ichi Yoshida
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090422 (p 363-365)

Failure mechanisms in life‐tested hemts

  • Author: W. T. Anderson, K. A. Christianson, C. Moglestue
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090423 (p 367-370)

Failures of ALGaAs/GaAs HEMTs induced by hot electrons

  • Author: C. Tedesco, C. Canali, F. Magistrali, A. Paccagnella, E. Zanoni
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090424 (p 371-376)

Very high temperature test of InP‐based laser diodes

  • Author: Monica Tesauri, Giovanni Chiorboli, Paolo Cova, Fausto Fantini, Fabrizio Magistrali, Danila Sala
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090425 (p 377-382)

Mathematical Corner

The complementary weibull distribution: Unknown or just forgotten?

  • Author: Antoni Drapella
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090426 (p 383-385)

Bimodal distribution. Are you sure?

  • Author: Antoni Drapella
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090427 (p 385-386)

News Digest

News digest

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090428 (p 387-390)

Special Issue of Qrei Testing Call for Papers

Special issue of qrei testing call for papers

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090429 (p 391-391)

International Calendar of Forthcoming Events

International calendar of forthcoming events

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090430 (p 392-395)
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