Quality and Reliability Engineering International

Table of Contents

Volume 9 Issue 2 (March/April 1993)

fmi-fmi, 81-160

Masthead

Masthead

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090201 (p fmi-fmi)

Editorial

Editorial

  • Author: Finn Jensen
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090202 (p 81-81)

LETTER TO THE EDITOR

Special report survey of the present status on critical reliability issues within europe

  • Author: Herman E. Maes
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090203 (p 83-84)

The Japanese point of view on the ISO 9000 standards

  • Author: Hitoshi Kume
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090204 (p 85-87)

Spc of a near zero‐defect process subject to random shocks

  • Author: M. Xie, T. N. Goh
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090205 (p 89-93)

A computer‐controlled environmental test system for high pin‐count integrated circuit packages

  • Author: John Barrett, John Ó Donavan, Thomas Hayes, Seán C.Ó Mathúna
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090206 (p 95-104)

Simple adjustments to improve control limits on attribute charts

  • Author: Alan Winterbottom
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090207 (p 105-109)

A method of identifying latent human errors in work systems

  • Author: Takeshi Nakajo
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090208 (p 111-119)

The electrical design for manufacture of ceramic capacitors

  • Author: C. D. Hannaford, H. Ingleson
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090209 (p 121-125)

An application of a bathtub failure model to imperfectly repaired systems data

  • Author: C. E. Love, R. Guo
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090210 (p 127-135)

Using sneak circuit analysis in aerospace product assurance

  • Author: Jürgen Deckers, Hendrik Schäbe
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090211 (p 137-142)

A comparative reliability assessment of 750nm, 1060nm and 1300nm high power surface light emitting diodes

  • Author: C. E. Lindsay
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090212 (p 143-147)

News Digest

News digest

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090213 (p 149-151)

International Claendar of Forthcoming Events

International claendar of forthcoming events

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090214 (p 152-155)

Special Issue of Qrei Testing Call for Papers

Special issue of qrei testing call for papers

  • Author:
  • Pub Online: Mar 20, 2007
  • DOI: 10.1002/qre.4680090215 (p 156-156)
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