Quality and Reliability Engineering International

Table of Contents

Volume 15 Issue 4 (July/August 1999)

251-335

Editorials

Editorial: Customer demands for quality and reliability for critical applications

  • Author: Edward B. Hakim
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<251::AID-QRE273>3.0.CO;2-I (p 251-251)

Research Articles

Reliability assessment of aerospace electronic equipment

  • Author: Lloyd Condra, Cosimo Bosco, Robert Deppe, Louis Gullo, James Treacy, Chris Wilkinson
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<253::AID-QRE270>3.0.CO;2-L (p 253-260)

A risk‐informed methodology for parts selection and management

  • Author: Margaret Jackson, Peter Sandborn, Michael Pecht, Chantal Hemens‐Davis, Pierre Audette
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<261::AID-QRE269>3.0.CO;2-0 (p 261-271)

A dependability strategy for next‐generation networks

  • Author: David Kiang
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<273::AID-QRE267>3.0.CO;2-# (p 273-278)

Automotive demands for quality and reliability in microelectronics

  • Author: Gerald E. Servais
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<279::AID-QRE268>3.0.CO;2-F (p 279-282)

Do we need a PEM reliability model?

  • Author: Edward B. Hakim
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<283::AID-QRE271>3.0.CO;2-F (p 283-286)

Developing identification techniques with the integrated use of SPC/EPC and neural networks

  • Author: Yuehjen E. Shao, Chih‐Chou Chiu
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<287::AID-QRE251>3.0.CO;2-5 (p 287-294)

Charting techniques for monitoring a random shock process

  • Author: T. C. Chang, F. F. Gan
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<295::AID-QRE252>3.0.CO;2-7 (p 295-301)

The analysis of covariance: a useful technique for analysing quality improvement experiments

  • Author: Kevin O. Silknitter, James W. Wisnowski, Douglas C. Montgomery
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<303::AID-QRE253>3.0.CO;2-G (p 303-316)

Using dual np ‐charts to detect changes

  • Author: Neil C. Schwertman, Thomas P. Ryan
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<317::AID-QRE254>3.0.CO;2-0 (p 317-320)

Making decisions in assessing process capability index C pk

  • Author: W. L. Pearn, K. S. Chen
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<321::AID-QRE258>3.0.CO;2-5 (p 321-326)

Web Site Survey

Web Site Survey

  • Author: C. K. Hansen
  • Pub Online: Aug 25, 1999
  • DOI: 10.1002/(SICI)1099-1638(199907/08)15:4<334::AID-QRE275>3.0.CO;2-2 (p 334-335)

Related Topics

Related Publications

Related Content

Site Footer

Address:

This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.