Quality and Reliability Engineering International

Table of Contents

Volume 19 Issue 1 (January/February 2003)

iii-iv, 1-86

Editorials

Education for Industrial Statisticians

  • Author:
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.531 (p iii-iv)

Applications

Integrating artificial intelligence into on‐line statistical process control

  • Author: Ruey‐Shiang Guh
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.510 (p 1-20)

Reinventing warranty at HP: an engineering approach to warranty

  • Author: Steve Kakouros, Brian Cargille, Marcos Esterman
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.512 (p 21-30)

Research Articles

Robustness properties of multivariate EWMA control charts

  • Author: Murat C. Testik, George C. Runger, Connie M. Borror
  • Pub Online: Aug 27, 2002
  • DOI: 10.1002/qre.498 (p 31-38)

Genetic algorithm optimization of a firewater deluge system

  • Author: J. D. Andrews, L. M. Bartlett
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.504 (p 39-52)

A continuous sampling plan using sums of conforming run‐lengths

  • Author: Patrick D. Bourke
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.507 (p 53-66)

On the performance quality of repairable systems

  • Author: M. S. Finkelstein
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.508 (p 67-72)

Tutorials

Testing for Reliability

  • Author: Patrick O'Connor
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.509 (p 73-84)

Book Reviews

Engineering Uncertainty and Risk Analysis , Sergio E. Serrano, Hydroscience Inc., 2001, 456 pages

  • Author: Patrick O'Connor
  • Pub Online: Feb 07, 2003
  • DOI: 10.1002/qre.486 (p 85-85)

Related Topics

Related Publications

Related Content

Site Footer

Address:

This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.