Canadian Journal of Statistics

Table of Contents

Volume 33 Issue 2 (June 2005)



Inference for domains under imputation for missing survey data

  • Author: David Haziza, J. N. K. Rao
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330201 (p 149-161)

Estimation of a finite population distribution function based on a linear model with unknown heteroscedastic errors

  • Author: María‐José Lombardí, Wenceslao González‐Manteiga, José‐Manuel Prada‐Sánchez
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330203 (p 181-200)

Using categorical markers as auxiliary variables in log‐rank tests and hazard ratio estimation

  • Author: Todd Mackenzie, Michal Abrahamowicz
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330204 (p 201-219)

Bayesian and maximin optimal designs for heteroscedastic regression models

  • Author: Holger Dette, Linda M. Haines, Lorens A. Imhof
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330205 (p 221-241)

Third order point process intensity estimation for reaction time experiment data

  • Author: Jennifer Asimit, W. John Braun
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330206 (p 243-257)

Kernel spline regression

  • Author: W. John Braun, Li‐Shan Huang
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330207 (p 259-278)

Smoothing parameter selection methods for nonparametric regression with spatially correlated errors

  • Author: Mario Francisco‐Fernandez, Jean D. Opsomer
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330208 (p 279-295)

The universal validity of the possible triangle constraint for affected sib pairs

  • Author: Zeny Z. Feng, Jiahua Chen, Mary E. Thompson
  • Pub Online: Feb 17, 2009
  • DOI: 10.1002/cjs.5550330209 (p 297-310)

Related Topics

Related Publications

Related Content

Site Footer


This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.