Quality and Reliability Engineering International

Critical Flow Method: A New Reliability Allocation Approach for a Thermonuclear System

Journal Article

In the present work, starting from well‐known methodologies, a new reliability allocation method [critical flow method (CFM)] has been proposed.

We focused on the most important conventional methods and discussed their limitations in order to motivate the current research. The results show the main common problem of the most conventional reliability allocation methods: they are developed for complex systems with series configurations but not for series–parallel ones. The consequence is an increase of the required units' reliability (series configuration) in order to guarantee the reliability system target.

Actually, the design and manufacturing of a subsystem with an extremely low failure rate would consume a considerable amount of economic resources. The proposed method can solve the shortcomings of the conventional methods with a new reliability approach useful to series–parallel configurations in order to obtain an important cost saving. The CFM has been applied to a liquid nitrogen cooling installation in a thermonuclear system, with many series–parallel configurations in order to guarantee the whole safety system. The proposed technique can be applied to working complex systems, and, in general, in the design phase of new installations. By comparing the CFM application results with real parameters, the new technique has been validated. The computational results clearly demonstrate the advantages of the proposed method. In particular, by applying the method to series–parallel configurations, it allocates failure rates higher than conventional methods, with a component cost reduction. Copyright © 2015 John Wiley & Sons, Ltd.

Related Topics

Related Publications

Related Content

Site Footer


This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.