Quality and Reliability Engineering International

New Synthetic EWMA and Synthetic CUSUM Control Charts for Monitoring the Process Mean

Journal Article

Exponentially weighted moving average (EWMA) and cumulative sum (CUSUM) control charts are potentially powerful statistical process monitoring tools because of their excellent speed in detecting small to moderate persistent process shifts. Recently, synthetic EWMA (SynEWMA) and synthetic CUSUM (SynCUSUM) control charts have been proposed based on simple random sampling (SRS) by integrating the EWMA and CUSUM control charts with the conforming run length control chart, respectively. These synthetic control charts provide overall superior detection over a range of mean shift sizes. In this article, we propose new SynEWMA and SynCUSUM control charts based on ranked set sampling (RSS) and median RSS (MRSS) schemes, named SynEWMA‐RSS and SynEWMA‐MRSS charts, respectively, for monitoring the process mean. Extensive Monte Carlo simulations are used to estimate the run length characteristics of the proposed control charts. The run length performances of these control charts are compared with their existing powerful counterparts based on SRS, RSS and MRSS schemes. It turns out that the proposed charts perform uniformly better than the Shewhart, optimal synthetic, optimal EWMA, optimal CUSUM, near‐optimal SynEWMA, near‐optimal SynCUSUM control charts based on SRS, and combined Shewhart‐EWMA control charts based on RSS and MRSS schemes. A similar trend is observed when constructing the proposed control charts based on imperfect RSS schemes. An application to a real data is also provided to demonstrate the implementations of the proposed SynEWMA and SynCUSUM control charts. Copyright © 2014 John Wiley & Sons, Ltd.

Related Topics

Related Publications

Related Content

Site Footer


This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.