Quality and Reliability Engineering International

A synthetic double sampling control chart for process mean using auxiliary information

Early View

Abstract A control chart is a simple yet powerful tool that is extensively adopted to monitor shifts in the process mean. In recent years, auxiliary‐information–based (AIB) control charts have received considerable attention as these control charts outperform their counterparts in monitoring changes in the process parameter(s). In this article, we integrate the conforming run length chart with the existing AIB double sampling (AIB DS) chart to propose an AIB synthetic DS chart for the process mean. The AIB synthetic DS chart also encompasses the existing synthetic DS chart. A detailed discussion on the construction, optimization, and evaluation of the run length profiles is provided for the proposed control chart. It is found that the optimal AIB synthetic DS chart significantly outperforms the existing AIB Shewhart, optimal AIB synthetic, and AIB DS charts in detecting various shifts in the process mean. An illustrative example is given to demonstrate the implementation of the existing and proposed AIB control charts.

Related Topics

Related Publications

Related Content

Site Footer

Address:

This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.