Quality and Reliability Engineering International

A new approach to statistically modelling the time dependent oxide breakdown

Journal Article

Abstract

For dielectric lifetime predictions, both, the characteristic lifetime of the distribution and its slope are important. Taking this into account, it is pointed out that the intrinsic breakdown time (a constant of the 1/E model) depends on the degradation behaviour of the weak spot under stress, which is represented by the failure percentage. A modified 1/E model is proposed. It considers the observed change of the slope of lifetime distributions taken at different electric fields. The modified model is in good accordance with available data. Furthermore, it includes the behaviour of the slope as predicted by the E and the 1/E models as special cases.

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