Quality and Reliability Engineering International

Simulation, a tool for designing‐in reliability

Journal Article

  • Author(s): Aarnout Brombacher, Erik Van Geest, Robert Arendsen, Anne Van Steenwijk, Otto Herrmann
  • Article first published online: 20 Mar 2007
  • DOI: 10.1002/qre.4680090403
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This paper describes a new method for the analysis and optimization of reliability as an integrated part of the design process of electronic circuits. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor‐sets). The paper describes the backgrounds of stressor‐susceptibility analysis, the need for this analysis and the way this method is used for high‐level design and optimization of electronic circuits.

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