Quality and Reliability Engineering International

Simulation, a tool for designing‐in reliability

Journal Article

  • Author(s): Aarnout Brombacher, Erik Van Geest, Robert Arendsen, Anne Van Steenwijk, Otto Herrmann
  • Article first published online: 20 Mar 2007
  • DOI: 10.1002/qre.4680090403
  • Read on Online Library
  • Subscribe to Journal

Abstract

This paper describes a new method for the analysis and optimization of reliability as an integrated part of the design process of electronic circuits. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor‐sets). The paper describes the backgrounds of stressor‐susceptibility analysis, the need for this analysis and the way this method is used for high‐level design and optimization of electronic circuits.

Related Topics

Related Publications

Related Content

Site Footer

Address:

This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.