Quality and Reliability Engineering International

A comparative reliability assessment of 750nm, 1060nm and 1300nm high power surface light emitting diodes

Journal Article


A comparative study of the reliability of high power double heterojunction surface light emitting diodes (SLEDs) operating at 750nm, 1060nm and 1300nm is reported. Data analysis from 9500 hours of fully automated life testing concludes that extremely reliable devices can be produced. Degradation and failure characteristics specific to each operating wavelength are described and related to structural and performance data on each device batch. Median life and activation energies are calculated.

Related Topics

Related Publications

Related Content

Site Footer


This website is provided by John Wiley & Sons Limited, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ (Company No: 00641132, VAT No: 376766987)

Published features on StatisticsViews.com are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and StatisticsViews.com express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.