Joint Meeting of y-BIS and jSPE


We are pleased to announce the first meeting of y-BIS (Young Business and Industrial Statisticians of the International Society for Business and Industrial Statistics) jointly with the first meeting of jSPE (Section of Young Statisticians of the Portuguese Statistical Society),

The purpose of the Joint Meeting of y-BIS and jSPE is to bring together young statisticians and professionals working in Academia and in Industry. The conference will offer opportunities to meet each other, and to share scientific and professional experiences. This meeting will cover many of the research areas in Probability and Statistics, and many areas of application. The session topics include but are not limited to the following areas: Business and Industrial Statistics; Applied Statistics; Computational and Graphical Statistics; Econometrics; Biostatistics; Environmental Statistics and Environmetrics; Bayesian Statistics; Extreme Value Statistics; Multivariate Statistics; Mathematical Statistics; Spatial Statistics; Time Series Analysis; Stochastic Processes; Actuarial Sciences; Probability Theory; Official Statistics; Survey Statistics; Statistical Education.

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Published features on are checked for statistical accuracy by a panel from the European Network for Business and Industrial Statistics (ENBIS)   to whom Wiley and express their gratitude. This panel are: Ron Kenett, David Steinberg, Shirley Coleman, Irena Ograjenšek, Fabrizio Ruggeri, Rainer Göb, Philippe Castagliola, Xavier Tort-Martorell, Bart De Ketelaere, Antonio Pievatolo, Martina Vandebroek, Lance Mitchell, Gilbert Saporta, Helmut Waldl and Stelios Psarakis.